Machine Vision Inspection Systems, Machine Learning-Based Approaches. Группа авторов

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       Scrivener Publishing

      100 Cummings Center, Suite 541J

      Beverly MA, 01915-6106

       Publishers at Scrivener

      Martin Scrivener ([email protected])

      Phillip Carmical ([email protected])

      Machine Vision Inspection Systems, Volume 2

      Machine Learning-Based Approaches

      Edited by

      Muthukumaran Malarvel

       Chitkara University Institute of Engineering and Technology, Chitkara University, Punjab, India

       Soumya Ranjan Nayak

       Amity School of Engineering and Technology, Amity University Uttar Pradesh, Noida, India

       Prasant Kumar Pattnaik

       School of Computer Engineering, KIIT Deemed to be University, India

       Surya Narayan Panda

       Chitkara University Institute of Engineering and Technology, Chitkara University, Punjab, India

      This edition first published 2021 by John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030, USA and Scrivener Publishing LLC, 100 Cummings Center, Suite 541J, Beverly, MA 01915, USA © 2021 Scrivener Publishing LLC

      For more information about Scrivener publications please visit www.scrivenerpublishing.com.

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       Limit of Liability/Disclaimer of Warranty

      While the publisher and authors have used their best efforts in preparing this work, they make no representations or warranties with respect to the accuracy or completeness of the contents of this work and specifically disclaim all warranties, including without limitation any implied warranties of merchantability or fitness for a particular purpose. No warranty may be created or extended by sales representatives, written sales materials, or promotional statements for this work. The fact that an organization, website, or product is referred to in this work as a citation and/or potential source of further information does not mean that the publisher and authors endorse the information or services the organization, website, or product may provide or recommendations it may make. This work is sold with the understanding that the publisher is not engaged in rendering professional services. The advice and strategies contained herein may not be suitable for your situation. You should consult with a specialist where appropriate. Neither the publisher nor authors shall be liable for any loss of profit or any other commercial damages, including but not limited to special, incidental, consequential, or other damages. Further, readers should be aware that websites listed in this work may have changed or disappeared between when this work was written and when it is read.

       Library of Congress Cataloging-in-Publication Data

      ISBN 978-1-119-78609-2

      Cover image: Pixabay.Com

      Cover design by: Russell Richardson

      Set in size of 11pt and Minion Pro by Manila Typesetting Company, Makati, Philippines

      Printed in the USA

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      Preface

      The edited book aims to bring together leading researchers, academic scientists, and research scholars to put forward and share their experiences and research results on all aspects of an inspection system for detection analysis for various machine vision applications. It also provides a premier interdisciplinary platform for educators, practitioners and researchers to present and discuss the most recent innovations, trends, methodology, applications, and concerns as well as practical challenges encountered and solutions adopted in the inspection system in terms of machine learning-based approaches of machine vision for real and industrial application. The book is organized into fourteen chapters.

      Chapter 1 deliberated about various dangerous infectious viruses affect human society with a detailed analysis of transmission electron microscopy virus images (TEMVIs). In this chapter, several TEMVIs such as Ebola virus (EV), Enterovirus (ENV), Lassa virus (LV), severe acute respiratory syndrome coronavirus 2 (SARS-CoV-2), Zika virus (ZV), etc. are analyzed. The ML-based approach mainly focuses on the classification techniques such as Logistic Regression (LR), Neural Network (NN), k-Nearest Neighbors (kNN) and Naive Bayes (NB) for the processing of TEMVIs.

      Chapter 2 focused to identify and differentiate handwriting characters using deep neural networks. As a solution to the character recognition problem in low resource languages, this chapter proposes a model that replicates the human cognition ability to learn with small datasets. The proposed solution is a Siamese neural network which bestows capsules and convolutional units to get a thorough understanding of the image. Further, this chapter attests that the capsule-based Siamese network could learn abstract knowledge about different characters which could be extended to unforeseen characters.

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