Applications and Metrology at Nanometer Scale 1. Abdelkhalak El Hami
Читать онлайн книгу.165
178 166
179 167
180 168
181 169
182 170
183 171
184 172
185 173
186 174
187 175
188 176
189 177
190 178
191 179
192 180
193 181
194 182
195 183
196 184
197 185
198 186
199 187
200 188
201 189
202 190
203 191
204 192
205 193
206 194
207 195
208 196
209 197
210 198
211 199
212 200
213 201
214 202
215 203
216 204
217 205
218 206
219 207
220 208
221 209
222 210
223 211
224 212
225 213
226 214
227 215
228 216
229 217
230 218
231 219
232 220
233 221
234 222
235 223
236 224
237 225
238 226
239 227
Reliability of Multiphysical Systems Set
coordinated by
Abdelkhalak El Hami
Volume 9
Applications and Metrology at Nanometer Scale 1
Smart Materials, Electromagnetic Waves and Uncertainties
Pierre-Richard Dahoo
Philippe Pougnet
Abdelkhalak El Hami
First published 2021 in Great Britain and the United States by ISTE Ltd and John Wiley & Sons, Inc.
Apart from any fair dealing for the purposes of research or private study, or criticism or review, as permitted under the Copyright, Designs and Patents Act 1988, this publication may only be reproduced, stored or transmitted, in any form or by any means, with the prior permission in writing of the publishers, or in the case of reprographic reproduction in accordance with the terms and licenses issued by the CLA. Enquiries concerning reproduction outside these terms should be sent to the publishers at the undermentioned address:
ISTE Ltd
27-37 St George’s Road
London SW19 4EU
UK
John Wiley & Sons, Inc.
111 River Street
Hoboken, NJ 07030
USA
© ISTE Ltd 2021
The rights of Pierre-Richard Dahoo, Philippe Pougnet and Abdelkhalak El Hami to be identified as the authors of this work have been asserted by them in accordance with the Copyright, Designs and Patents Act 1988.
Library of Congress Control Number: 2020946679
British Library Cataloguing-in-Publication Data
A CIP record for this book is available from the British Library
ISBN 978-1-78630-640-1
Preface
The various actions taken worldwide in support of sustainable development and greenhouse gas emission control have led to increasingly restrictive regulations. Manufacturers in the automotive field have thus developed innovative mechatronic systems, enabling various vehicle functions to go electric. Confronted with the globalization of exchanges that has generated stronger competition and a surge of new product performances, companies in the sector of embedded mechatronic systems are developing new products at an increasingly faster rate.
In other domains, to achieve volume or mass reduction or curb energy dissipation, manufacturers of mechatronic systems are developing new assembly methods based on multimaterials (e.g. composite materials, hybrids) or on innovative nanomaterials (e.g. carbon nanotubes). Modeling is essential to reduce product development cost, shrink time to market, understand failure mechanisms occurring in the operating conditions and optimize design before launching production. The reliability-based design optimization (RBDO) method is a modeling approach that optimizes design, guarantees the required high level of performance and takes into account the variability in the manufacturing process as well as the climatic variability in the use conditions. The efficiency of RBDO, however, depends on a solid understanding of the failure mechanisms caused by aging.
Creating a model of a dynamic system often involves developing a simplified model of its behavior based on realistic hypotheses and on the key parameters that are required for its functioning. The dynamic behavior of this modeled system is ruled by partial differential equations (PDEs). The model is then improved by introducing elements or parameters that were not initially included and by improving the set